DEPARTMENT OF CHEMISTRY
INDIAN INSTITUTE OF TECHNOLOGY MADRAS

Scanning electron microscopy (SEM)

SCANNING ELECTRON MICROSCOPE 

 

Make: FEI

Model : Quanta 450
Specifications:
Source: Tungsten filament up to 30kV
Magnification: up to 100000
Mode: HighVacuum (for conductors), Low Vacuum(for insulators)

Scanning Electron microscope is used for surface morphology studies, particle size, shape and other
topographical studies of various materials like metal, ceramic , catalyst, polymer etc..
Fracture surface of material, micro indentation and Nano materials are imaged using this technique.